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Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire optical windows
Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire optical windows
Material: Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire optical windows
Orientation: C-axis, A-plane, M-axis, Random
Diameter Tolerance: Through+/-0.005mm over +/-0.2mm
Thickness Tolerance: Through+/-0.005mm over +/-0.2mm
Clear Aperture: Central 90% of Diameter
Parallelism: >5 arc second
Flatness:: 1/8¦Ë @ 632.8nm
Surface Quality: 80-50,60-40,40-20, 20-10,free scratch-dig per MIL-O-13830-A
Sapphy optical windows
Material: Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire
Orientation: C-axis, A-plane, M-axis, Random
Diameter Tolerance: Through+/-0.005mm over +/-0.2mm
Thickness Tolerance: Through+/-0.005mm over +/-0.2mm
Clear Aperture: Central 90% of Diameter
Parallelism: >5 arc second
Flatness:: 1/8¦Ë @ 632.8nm
Surface Quality: 80-50,60-40,40-20, 20-10,free scratch-dig per MIL-O-13830-A
Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire optical windows
Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire optical windows
Material: Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire
Orientation: C-axis, A-plane, M-axis, Random
Diameter Tolerance: Through+/-0.005mm over +/-0.2mm
Thickness Tolerance: Through+/-0.005mm over +/-0.2mm
Clear Aperture: Central 90% of Diameter
Parallelism: >5 arc second
Flatness:: 1/8¦Ë @ 632.8nm
Surface Quality: 80-50,60-40,40-20, 20-10,free scratch-dig per MIL-O-13830-A
Material: Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire
Orientation: C-axis, A-plane, M-axis, Random
Diameter Tolerance: Through+/-0.005mm over +/-0.2mm
Thickness Tolerance: Through+/-0.005mm over +/-0.2mm
Clear Aperture: Central 90% of Diameter
Parallelism: >5 arc second
Flatness:: 1/8¦Ë @ 632.8nm
Surface Quality: 80-50,60-40,40-20, 20-10,free scratch-dig per MIL-O-13830-A
Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire optical windows
Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire optical windows
Material: Optical IR/UV/VBLE Kyropoulos,Czochralski ,Verneuil,EFG Method single crystal Sapphire
Orientation: C-axis, A-plane, M-axis, Random
Diameter Tolerance: Through+/-0.005mm over +/-0.2mm
Thickness Tolerance: Through+/-0.005mm over +/-0.2mm
Clear Aperture: Central 90% of Diameter
Parallelism: >5 arc second
Flatness:: 1/8¦Ë @ 632.8nm
Surface Quality: 80-50,60-40,40-20, 20-10,free scratch-dig per MIL-O-13830-A
 
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